HICHAM
BAKKALI
Investigador en el periodo 2017-2023
Universidad Nacional Autónoma de México
Ciudad de México, MéxicoPublicaciones en colaboración con investigadores/as de Universidad Nacional Autónoma de México (3)
2022
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Spectroscopic Ellipsometry Study on Tuning the Electrical and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition
ACS Applied Electronic Materials, Vol. 4, Núm. 3, pp. 925-935
2020
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The effect of oblique-angle sputtering on large area deposition: A unidirectional ultrathin Au plasmonic film growth design
Nanotechnology, Vol. 31, Núm. 44
2017
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Optical properties of Au–TiO 2 and Au–SiO 2 granular metal thin films studied by Spectroscopic Ellipsometry
Applied Surface Science, Vol. 405, pp. 240-246