date_range Iraupena 2019(e)ko urtarrila-(a)k 01-(e)tik 2022(e)ko iraila-(a)k 30-(e)ra izan da (45 months) Amaitu
Deialdi: Retos de la Sociedad. Plan Nacional I+D+i

Ikertzaileak

Foto de MARIA INMACULADA
MARIA INMACULADA
MEDINA BULO
Arduraduna
Foto de GUADALUPE
GUADALUPE
ORTIZ BELLOT
Erantzuleak
Foto de JUAN
JUAN
BOUBETA PUIG
Foto de MARIA CARMEN
MARIA CARMEN
CASTRO CABRERA
Foto de PEDRO
PEDRO
DELGADO PEREZ
Foto de JUAN JOSE
JUAN JOSE
DOMINGUEZ JIMENEZ
Foto de ANTONIA
ANTONIA
ESTERO BOTARO
Foto de ALFONSO
ALFONSO
GARCIA DE PRADO FONTELA
Foto de LORENA
LORENA
GUTIERREZ MADROÑAL
Foto de FRANCISCO
FRANCISCO
PALOMO LOZANO

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Erakutsi urterokoaren arabera

Artikulua

  1. IoT-TEG 4.0: A New Approach 4.0 for Test Event Generation 2022

    IEEE Transactions on Reliability

Biltzar ekarpena

  1. Combining Evolutionary Mutation Testing with Random Selection 2020

    2020 IEEE Congress on Evolutionary Computation, CEC 2020 - Conference Proceedings

  2. Evolutionary mutation testing for IoT with recorded and generated events 2019

    Software - Practice and Experience