IoT-TEG 4.0: A New Approach 4.0 for Test Event Generation

Journal:

IEEE Transactions on Reliability

ISSN: 1558-1721, 0018-9529

Year of publication: 2022

Volume: 71

Issue: 3

Pages: 1368-1380

Type: Article

DOI: 10.1109/TR.2021.3087781 GOOGLE SCHOLAR Open access editor

Sustainable development goals

3212

4134

Data source: Scopus