Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
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Center for Scientific Research and Higher Education at Ensenada
Ensenada, MéxicoCenter for Scientific Research and Higher Education at Ensenada-ko ikertzaileekin lankidetzan egindako argitalpenak (2)
2022
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Spectroscopic Ellipsometry Study on Tuning the Electrical and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition
ACS Applied Electronic Materials, Vol. 4, Núm. 3, pp. 925-935
2003
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A method for computing the characteristic impedance of transmission lines using the wave cascade matrix formalism
61st ARFTG Conference Digest Spring 2003: Measurement Accuracy, ARFTG Spring 2003