Ingeniería Informática
Departamento
Instituto de Microelectrónica de Madrid
Madrid, EspañaPublicaciones en colaboración con investigadores/as de Instituto de Microelectrónica de Madrid (14)
2011
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Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy
Microscopy and Microanalysis, Vol. 17, Núm. 4, pp. 578-581
2010
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Exploring semiconductor quantum dots and wires by high resolution electron microscopy
Journal of Physics: Conference Series
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Morphological evolution of InAs/InP quantum wires through aberration-corrected scanning transmission electron microscopy
Nanotechnology, Vol. 21, Núm. 32
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Theoretical modelling of quaternary GaInAsSb/GaAs self-assembled quantum dots
Journal of Physics: Conference Series
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Transmission electron microscopy study of vertical quantum dots molecules grown by droplet epitaxy
Applied Surface Science, Vol. 256, Núm. 18, pp. 5659-5661
2009
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Column-by-column compositional mapping by Z-contrast imaging
Ultramicroscopy, Vol. 109, Núm. 2, pp. 172-176
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Erratum to: "Column-by-column compositional mapping by Z-contrast imaging" [Ultramicroscopy 109(2) (2009) 172-176] (DOI:10.1016/j.ultramic.2008.10.008)
Ultramicroscopy
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High resolution electron microscopy of GaAs capped GaSb nanostructures
Applied Physics Letters, Vol. 94, Núm. 4
2008
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A method to determine the strain and nucleation sites of stacked nano-objects
Journal of Nanoscience and Nanotechnology, Vol. 8, Núm. 7, pp. 3422-3426
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Experimental and simulated strain field maps in stacked quantum wires
Microscopy and Microanalysis
2007
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Determination of the Strain Field in Nano-Objects from Aberration-Corrected Z-contrast Images
Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007
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Direct imaging of quantum wires nucleated at diatomic steps
Applied Physics Letters, Vol. 91, Núm. 14
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Incorporation of Sb in InAsGaAs quantum dots
Applied Physics Letters, Vol. 91, Núm. 26
2006
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Determination of the strain generated in InAs/InP quantum wires: Prediction of nucleation sites
Nanotechnology, Vol. 17, Núm. 22, pp. 5652-5658