Determination of the Strain Field in Nano-Objects from Aberration-Corrected Z-contrast Images

  1. SI Molina 1
  2. M Varela 2
  3. DL Sales 1
  4. T Ben 1
  5. J Pizarro 1
  6. PL Galindo 1
  7. D Fuster 3
  8. Y Gonzalez 3
  9. L Gonzalez 3
  10. S Pennycook 2
  1. 1 University of Cadiz, Spain
  2. 2 Oak Ridge National Laboratory
    info

    Oak Ridge National Laboratory

    Oak Ridge, Estados Unidos

    ROR https://ror.org/01qz5mb56

  3. 3 Instituto de Microelectrónica de Madrid
    info

    Instituto de Microelectrónica de Madrid

    Madrid, España

    ROR https://ror.org/01yhwa418

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Proceedings:
Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Publisher: Cambridge University Press

ISSN: 1435-8115,  1431-9276

Year of publication: 2007

Volume: 13

Issue: S02

Pages: 746-747

Type: Conference paper

DOI: 10.1017/S1431927607074971 GOOGLE SCHOLAR lock_openOpen access editor