Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Ikerketa institutua
University of Johannesburg
Johannesburgo, SudáfricaUniversity of Johannesburg-ko ikertzaileekin lankidetzan egindako argitalpenak (2)
1995
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Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only
Applied Optics, Vol. 34, Núm. 34, pp. 7907-7913
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Optical characterization of wedge-shaped thin films of amorphous arsenic trisulphide based only on their shrunk transmission spectra
Thin Solid Films, Vol. 254, Núm. 1-2, pp. 83-91