Forschungsinstitut
Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Anmerkungen (3) Publikationen, an denen Forscher/innen teilgenommen haben
2016
-
(S)TEM Analysis of the Strain and Morphology of InAs Quantum Dots using GaAs(Sb)(N) Capping Layers for Solar Cell Applications
Microscopy and Microanalysis
-
HAADF-STEM analysis of the composition distribution in InAlAsSb/InGaAs/InP layers for solar cells applications
Microscopy and Microanalysis
-
Structural quality of GaSb/GaAs quantum dots for solar cells analyzed by electron microscopy techniques
Microscopy and Microanalysis