An ellipsometric analysis to model the order-disorder transition in Au-SiO2 nano-granular thin films induced by thermal annealing
- Bakkali, H.
- Blanco, E.
- Amrani, M.
- Brigui, J.
- Domínguez, M.
Journal:
Thin Solid Films
ISSN: 0040-6090
Year of publication: 2018
Volume: 660
Pages: 455-462
Type: Article