Influence of the crosstalk on the intensity of HAADF-STEM images of quaternary semiconductor materials

  1. Baladés, N.
  2. Herrera, M.
  3. Sales, D.L.
  4. Guerrero, M.P.
  5. Guerrero, E.
  6. Galindo, P.L.
  7. Molina, S.I.
Journal:
Journal of Microscopy

ISSN: 1365-2818 0022-2720

Year of publication: 2019

Volume: 273

Issue: 1

Pages: 81-88

Type: Article

DOI: 10.1111/JMI.12763 GOOGLE SCHOLAR lock_openOpen access editor