Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images
- Galindo, P.L.
- Ponce, A.
- Molina, S.I.
Buch:
Microscopy of Semiconducting Materials 2003
ISBN: 9781315895536
Datum der Publikation: 2018
Seiten: 23-26
Art: Buch-Kapitel