Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images
- Galindo, P.L.
- Ponce, A.
- Molina, S.I.
Livre:
Microscopy of Semiconducting Materials 2003
ISBN: 9781315895536
Année de publication: 2018
Pages: 23-26
Type: Chapitre d'ouvrage