Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum

1. Minkov, D.A.
2. Gavrilov, G.M.
3. Angelov, G.V.
4. Moreno, J.M.D.
5. Vazquez, C.G.
6. Ruano, S.M.F.
7. Marquez, E.