Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum
- Minkov, D.A.
- Gavrilov, G.M.
- Angelov, G.V.
- Moreno, J.M.D.
- Vazquez, C.G.
- Ruano, S.M.F.
- Marquez, E.
Revista:
Thin Solid Films
ISSN: 0040-6090
Ano de publicación: 2018
Volume: 645
Páxinas: 370-378
Tipo: Artigo