(S)TEM Analysis of the Strain and Morphology of InAs Quantum Dots using GaAs(Sb)(N) Capping Layers for Solar Cell Applications

  1. Reyes, D.F.
  2. Utrilla, A.D.
  3. Ben, T.
  4. Saborido, J.J.
  5. Ulloa, J.M.
  6. Bárcena-Gonzálz, G.
  7. GuerreroLebrero, M.P.
  8. Guerrero, E.
  9. Gonzalez, D.
Journal:
Microscopy and Microanalysis

ISSN: 1435-8115 1431-9276

Year of publication: 2016

Volume: 22

Pages: 46-47

Type: Note

DOI: 10.1017/S1431927616000428 GOOGLE SCHOLAR lock_openOpen access editor