Size and critical thickness evolution during growth of stacked layers of InAs/InP(001) quantum wires studied by in situ stress measurements

  1. Fuster, D.
  2. González, M.U.
  3. González, L.
  4. González, Y.
  5. Ben, T.
  6. Ponce, A.
  7. Molina, S.I.
Proceedings:
Materials Research Society Symposium - Proceedings

ISSN: 0272-9172

Year of publication: 2003

Volume: 794

Pages: 119-124

Type: Conference paper

DOI: 10.1557/PROC-794-T5.3 GOOGLE SCHOLAR
Data source: Scopus