Size and critical thickness evolution during growth of stacked layers of InAs/InP(001) quantum wires studied by in situ stress measurements

  1. Fuster, D.
  2. González, M.U.
  3. González, L.
  4. González, Y.
  5. Ben, T.
  6. Ponce, A.
  7. Molina, S.I.
Actes de conférence:
Materials Research Society Symposium - Proceedings

ISSN: 0272-9172

Année de publication: 2003

Volumen: 794

Pages: 119-124

Type: Communication dans un congrès

DOI: 10.1557/PROC-794-T5.3 GOOGLE SCHOLAR
La source de données: Scopus