A single slice approach for simulating two-beam electron diffraction of nanocrystals

  1. Gontard, L.C.
  2. Barroso-Bogeat, A.
  3. Dunin-Borkowski, R.E.
  4. Calvino, J.J.
Revue:
Ultramicroscopy

ISSN: 1879-2723,  0304-3991

Année de publication: 2018

Volumen: 195

Pages: 171-188

Type: Article

DOI: 10.1016/J.ULTRAMIC.2018.09.004 GOOGLE SCHOLAR
La source de données: Scopus