Misfit dislocations between boron-doped homoepitaxial films and diamond substrates studied by X-ray diffraction topography

  1. González-Mañas, M.
  2. Vallejo, B.
Journal:
Journal of Applied Crystallography

ISSN: 1600-5767,  0021-8898

Year of publication: 2018

Volume: 51

Issue: 6

Pages: 1684-1690

Type: Article

DOI: 10.1107/S1600576718015388 GOOGLE SCHOLAR
Data source: Scopus