Misfit dislocations between boron-doped homoepitaxial films and diamond substrates studied by X-ray diffraction topography

  1. González-Mañas, M.
  2. Vallejo, B.
Revista:
Journal of Applied Crystallography

ISSN: 1600-5767,  0021-8898

Ano de publicación: 2018

Volume: 51

Número: 6

Páxinas: 1684-1690

Tipo: Artigo

DOI: 10.1107/S1600576718015388 GOOGLE SCHOLAR
Fonte de datos: Scopus