Effect of dislocations on electrical and electron transport properties of InN thin films. I. Strain relief and formation of a dislocation network
- Lebedev, V.
- Cimalla, V.
- Pezoldt, J.
- Himmerlich, M.
- Krischok, S.
- Schaefer, J.A.
- Ambacher, O.
- Morales, F.M.
- Lozano, J.G.
- González, D.
Journal:
Journal of Applied Physics
ISSN: 0021-8979
Year of publication: 2006
Volume: 100
Issue: 9
Type: Article