3D characterization and metrology of nanostructures by electron tomography

  1. Hernandez, J.C.
  2. Hungria, A.B.
  3. Perez-Omil, J.A.
  4. Moreno, M.S.
  5. Coronado, E.A.
  6. Cempura, G.
  7. Kruk, A.
  8. Midgley, P.A.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276,  1435-8115

Année de publication: 2008

Volumen: 14

Número: SUPPL. 2

Pages: 284-285

Type: Communication dans un congrès

DOI: 10.1017/S1431927608087394 GOOGLE SCHOLAR
La source de données: Scopus