Analysis of bi distribution in epitaxial gaasbi by aberration-corrected HAADF-STEM

  1. Baladés, N.
  2. Sales, D.L.
  3. Herrera, M.
  4. Tan, C.H.
  5. Liu, Y.
  6. Richards, R.D.
  7. Molina, S.I.
Aldizkaria:
Nanoscale Research Letters

ISSN: 1556-276X,  1931-7573

Argitalpen urtea: 2018

Alea: 13

Zenbakia: 1

Mota: Artikulua

DOI: 10.1186/S11671-018-2530-5 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus