Analysis of bi distribution in epitaxial gaasbi by aberration-corrected HAADF-STEM
- Baladés, N.
- Sales, D.L.
- Herrera, M.
- Tan, C.H.
- Liu, Y.
- Richards, R.D.
- Molina, S.I.
ISSN: 1556-276X, 1931-7573
Année de publication: 2018
Volumen: 13
Número: 1
Type: Article