Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers
- Ponce, A.
- Molina, S.I.
- García-López, J.
- Battistig, G.
ISSN: 1478-0585
Année de publication: 2004
Volumen: 6
Pages: 305-308
Type: Communication dans un congrès