Comparison of the thickness determined by Fresnel contrast and Rutherford backscattering spectrometry in ultra-thin layers

  1. Ponce, A.
  2. Molina, S.I.
  3. García-López, J.
  4. Battistig, G.
Collection de livres:
Design and Nature

ISSN: 1478-0585

Année de publication: 2004

Volumen: 6

Pages: 305-308

Type: Communication dans un congrès