Critical thickness of high-temperature AIN interlayers in GaN on sapphire (0001)

  1. Sanchez, A.M.
  2. Pacheco, F.J.
  3. Molina, S.I.
  4. Stemmer, J.
  5. Aderhold, J.
  6. Graul, J.
Journal:
Journal of Electronic Materials

ISSN: 0361-5235

Year of publication: 2001

Volume: 30

Issue: 5

Pages: L17-L20

Type: Letter

DOI: 10.1007/S11664-001-0098-8 GOOGLE SCHOLAR
Data source: Scopus