The benefit of thresholding carbon layers in electron tomographic tilt series by intensity downshifting

  1. Gontard, L.C.
  2. Cintas, J.
  3. Borkowski, R.E.D.
Aldizkaria:
Journal of Microscopy

ISSN: 1365-2818,  0022-2720

Argitalpen urtea: 2017

Alea: 265

Zenbakia: 3

Orrialdeak: 298-306

Mota: Artikulua

DOI: 10.1111/JMI.12498 GOOGLE SCHOLAR
Datuen iturria: Scopus