The benefit of thresholding carbon layers in electron tomographic tilt series by intensity downshifting

  1. Gontard, L.C.
  2. Cintas, J.
  3. Borkowski, R.E.D.
Revue:
Journal of Microscopy

ISSN: 1365-2818,  0022-2720

Année de publication: 2017

Volumen: 265

Número: 3

Pages: 298-306

Type: Article

DOI: 10.1111/JMI.12498 GOOGLE SCHOLAR
La source de données: Scopus