Disorder-order phase transformation in a fluorite-related oxide thin film: In-situ X-ray diffraction and modelling of the residual stress effects

  1. Gaboriaud, R.J.
  2. Paumier, F.
  3. Lacroix, B.
Revista:
Thin Solid Films

ISSN: 0040-6090

Any de publicació: 2016

Volum: 601

Pàgines: 84-88

Tipus: Article

DOI: 10.1016/J.TSF.2015.08.030 GOOGLE SCHOLAR