Disorder-order phase transformation in a fluorite-related oxide thin film: In-situ X-ray diffraction and modelling of the residual stress effects
- Gaboriaud, R.J.
- Paumier, F.
- Lacroix, B.
Journal:
Thin Solid Films
ISSN: 0040-6090
Year of publication: 2016
Volume: 601
Pages: 84-88
Type: Article