Disorder-order phase transformation in a fluorite-related oxide thin film: In-situ X-ray diffraction and modelling of the residual stress effects
- Gaboriaud, R.J.
- Paumier, F.
- Lacroix, B.
Aldizkaria:
Thin Solid Films
ISSN: 0040-6090
Argitalpen urtea: 2016
Alea: 601
Orrialdeak: 84-88
Mota: Artikulua