Synthesis, structuring and characterization of rare earth oxide thin films: Modeling of the effects of stress and defects on the phase stability

  1. Gaboriaud, R.J.
  2. Paumier, F.
  3. Lacroix, B.
Revue:
Thin Solid Films

ISSN: 0040-6090

Année de publication: 2014

Volumen: 553

Pages: 43-46

Type: Communication dans un congrès

DOI: 10.1016/J.TSF.2013.12.035 GOOGLE SCHOLAR
La source de données: Scopus