Synthesis, structuring and characterization of rare earth oxide thin films: Modeling of the effects of stress and defects on the phase stability

  1. Gaboriaud, R.J.
  2. Paumier, F.
  3. Lacroix, B.
Revista:
Thin Solid Films

ISSN: 0040-6090

Ano de publicación: 2014

Volume: 553

Páxinas: 43-46

Tipo: Achega congreso

DOI: 10.1016/J.TSF.2013.12.035 GOOGLE SCHOLAR