Polarity determination of polar and semipolar (112̄2) InN and GaN layers by valence band photoemission spectroscopy
- Skuridina, D.
- Dinh, D.V.
- Lacroix, B.
- Ruterana, P.
- Hoffmann, M.
- Sitar, Z.
- Pristovsek, M.
- Kneissl, M.
- Vogt, P.
Journal:
Journal of Applied Physics
ISSN: 0021-8979
Year of publication: 2013
Volume: 114
Issue: 17
Type: Article