Polarity determination of polar and semipolar (112̄2) InN and GaN layers by valence band photoemission spectroscopy
- Skuridina, D.
- Dinh, D.V.
- Lacroix, B.
- Ruterana, P.
- Hoffmann, M.
- Sitar, Z.
- Pristovsek, M.
- Kneissl, M.
- Vogt, P.
Aldizkaria:
Journal of Applied Physics
ISSN: 0021-8979
Argitalpen urtea: 2013
Alea: 114
Zenbakia: 17
Mota: Artikulua