The high sensitivity of InN under rare earth ion implantation at medium range energy

  1. Lacroix, B.
  2. Chauvat, M.P.
  3. Ruterana, P.
  4. Lorenz, K.
  5. Alves, E.
  6. Syrkin, A.
Revue:
Journal of Physics D: Applied Physics

ISSN: 0022-3727,  1361-6463

Année de publication: 2011

Volumen: 44

Número: 29

Type: Article

DOI: 10.1088/0022-3727/44/29/295402 GOOGLE SCHOLAR
La source de données: Scopus