Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor

  1. Gontard, L.C.
  2. Moldovan, G.
  3. Carmona-Galán, R.
  4. Lin, C.
  5. Kirkland, A.I.
Journal:
Microscopy

ISSN: 2050-5701,  2050-5698

Year of publication: 2014

Volume: 63

Issue: 2

Pages: 119-130

Type: Article

DOI: 10.1093/JMICRO/DFT051 GOOGLE SCHOLAR
Data source: Scopus