Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor

  1. Gontard, L.C.
  2. Moldovan, G.
  3. Carmona-Galán, R.
  4. Lin, C.
  5. Kirkland, A.I.
Aldizkaria:
Microscopy

ISSN: 2050-5701,  2050-5698

Argitalpen urtea: 2014

Alea: 63

Zenbakia: 2

Orrialdeak: 119-130

Mota: Artikulua

DOI: 10.1093/JMICRO/DFT051 GOOGLE SCHOLAR
Datuen iturria: Scopus