A robust SVM-based approach with feature selection and outliers detection for classification problems

  1. Baldomero-Naranjo, M.
  2. Martínez-Merino, L.I.
  3. Rodríguez-Chía, A.M.
Revista:
Expert Systems with Applications

ISSN: 0957-4174

Año de publicación: 2021

Volumen: 178

Tipo: Artículo

DOI: 10.1016/J.ESWA.2021.115017 GOOGLE SCHOLAR