Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending
- Escobar Galindo, R.
- Van Veen, A.
- Schut, H.
- Carvalho, N.J.M.
- Strondl, C.
- De Hosson, J.T.
Revue:
Materials Research Society Symposium - Proceedings
ISSN: 0272-9172
Année de publication: 2002
Volumen: 695
Pages: 397-402
Type: Article