Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending
- Escobar Galindo, R.
- Van Veen, A.
- Schut, H.
- Carvalho, N.J.M.
- Strondl, C.
- De Hosson, J.T.
Revista:
Materials Research Society Symposium - Proceedings
ISSN: 0272-9172
Ano de publicación: 2002
Volume: 695
Páxinas: 397-402
Tipo: Artigo