Determination of the Strain Field in Nano-Objects from Aberration-Corrected Z-contrast Images
- SI Molina 1
- M Varela 2
- DL Sales 1
- T Ben 1
- J Pizarro 1
- PL Galindo 1
- D Fuster 3
- Y Gonzalez 3
- L Gonzalez 3
- S Pennycook 2
- 1 University of Cadiz, Spain
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2
Oak Ridge National Laboratory
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3
Instituto de Microelectrónica de Madrid
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Éditorial: Cambridge University Press
ISSN: 1435-8115, 1431-9276
Année de publication: 2007
Volumen: 13
Número: S02
Pages: 746-747
Type: Communication dans un congrès