On the application of advanced computing techniques for the determination of thickness and defocus from high resolution transmission electron microscopy images

1. P.L.Galindo
2. F.J.Pacheco
3. S.I.Molina
4. A.M. Sánchez
5. R.García
6. I.Turias
7. E.Guerrero
8. A. Yánez
9. J.Pizarro