On the application of advanced computing techniques for the determination of thickness and defocus from high resolution transmission electron microscopy images
- P.L.Galindo
- F.J.Pacheco
- S.I.Molina
- A.M. Sánchez
- R.García
- I.Turias
- E.Guerrero
- A. Yánez
- J.Pizarro
Argitaletxea: Techna Group
ISBN: ISBN-10: 8886538324 ISBN-13: 9788886538329
Argitalpen urtea: 2003
Orrialdeak: 165-172
Mota: Biltzar ekarpena