Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images
- Galindo, PL
- Ponce, A
- Molina, SI
- Cullis, AG (coord.)
- Midgley, PA (coord.)
ISSN: 0951-3248
ISBN: 0-7503-0979-2
Año de publicación: 2003
Páginas: 23-26
Congreso: Conference on Microscopy of Semiconducting Materials
Tipo: Aportación congreso