Beta to alpha transition and defects on SiC on Si grown by CVD
- Morales, F. M.
- Foerster, Ch
- Ambacher, O.
- Pezoldt, J.
- Cullis, AG (coord.)
- Hutchison, JL (coord.)
ISSN: 0930-8989, 1867-4941
ISBN: 3-540-31914-X
Ano de publicación: 2005
Volume: 107
Páxinas: 131-134
Congreso: 14th Conference on Microscopy of Semiconducting Materials
Tipo: Achega congreso