A method for thin foil thickness determination by transmission electron microscopy

  1. Castro Riglos, M.V.
  2. Tolley, A.
Revue:
Applied Surface Science

ISSN: 0169-4332

Année de publication: 2007

Volumen: 254

Número: 1 SPEC. ISS.

Pages: 420-424

Type: Article

DOI: 10.1016/J.APSUSC.2007.07.057 GOOGLE SCHOLAR
La source de données: Scopus