Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample

  1. Minkov, D.
  2. Angelov, G.
  3. Marquez, E.
  4. Radonov, R.
  5. Rusev, R.
  6. Nikolov, D.
  7. Ruano, S.
Revista:
Nanomaterials

ISSN: 2079-4991

Any de publicació: 2023

Volum: 13

Número: 17

Tipus: Article

DOI: 10.3390/NANO13172407 GOOGLE SCHOLAR lock_openAccés obert editor
Font de les dades: Scopus