Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample

1. Minkov, D.
2. Angelov, G.
3. Marquez, E.
4. Radonov, R.
5. Rusev, R.
6. Nikolov, D.
7. Ruano, S.

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DOI: 10.3390/NANO13172407 GOOGLE SCHOLAR lock_openOpen access editor

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