Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample

  1. Minkov, D.
  2. Angelov, G.
  3. Marquez, E.
  4. Radonov, R.
  5. Rusev, R.
  6. Nikolov, D.
  7. Ruano, S.
Aldizkaria:
Nanomaterials

ISSN: 2079-4991

Argitalpen urtea: 2023

Alea: 13

Zenbakia: 17

Mota: Artikulua

DOI: 10.3390/NANO13172407 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus